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Yandong He Researcher, Department of Micro and Nano Electronics, Peking University, Beijing, China.
Research: Device and IC Reliability Design, Characterization and Prediction
Email: heyd@pku.edu.cn
Phone: 010-62767915
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She graduated from the Department of Radio Electronics and the Department of Microelectronics, School of Information Science and Technology, Peking University, with B.S., M.S. and Ph. She worked at Agilent Technology and Chartered Semiconductor Manufacturing, where she was involved in R&D of electromechanical automation equipment and integration of advanced IC process technology, and participated in the development of advanced IC process (0.13um and 90nm). Since 2003, she has been working at the School of Information Science and Technology, Peking University, where she is now engaged in the design and development of advanced integrated circuit devices, high-voltage and silicon-based optoelectronic devices, characterization methodology, reliability circuit design, and model parameter extraction. She has undertaken and participated in the research of national key scientific and technological research, national defense military electronic pre-research, 973, major special projects and other projects.


Overview of research results:

In the field of scientific research, she has published more than 50 major academic papers in academic journals and conferences at home and abroad independently and in cooperation with others, and is the first inventor of 12 national invention patents and 1 U.S. invention patent. She has been awarded the "Ninth Five-Year Plan" Science and Technology Research Outstanding Achievement Award, the Third Prize of National Defense Science and Technology, and the First Prize of Beijing Science and Technology Award in 2007.